HET Instrument 2010

HET Instrument 2010

HET Instrument is the biggest technology exhibition in the Benelux. This year, it will be taken place at Amsterdam RAI from Tuesday 28 September through 1 October 2010.
There will be 450 exhibitors who represent companies in the various branches: industrial electronics, industrial automation and laboratory technology.

Micro-optik (a busines unit of Flokal BV) would like to invite you to come and visit our booth at Het Instrument: Booth C075, Hall 1, Amsterdam RAI. For advance registration, please click here.

Our specialists will be very pleased to meet you and present our new line of products. We appreciate all the interesting and inspiring discussions about your applications and how our products might fit to help you out.

We shall be glad to discuss a lot of different technologies related to process industry, electronic production, 3D microscopic image analysis and other.

Over here, you will also have chance to experience our newest technology with respect to applied digital video microscopy and machine vision inspection systems.

DiMiC™ 3D xyz topography scanner

A true novelty is our DiMiC™ 3D xyz topography scanner.
The instrument is capable to scan an entire wafer, object or electronical product and generates a 3D structure with very high accuracy. The technique is based on Flokal’s proprietary hybrid laser DFD technology. Our developers have taken Depth From Defocus technology to the next level of sophistication.

3D rotation head inspection system

Another novelty is our 3D rotation head inspection system. With this video microscope we can inspect all kinds of material and objects from various angles with a 360° rotation. The images are superb in quality and can be used for any object. Ideal for quality control in electronical and plastic production.

Smart-eye™ products

Also we are proud to introduce our new line of Smart-eye™ products. These are compact mini-camera’s which can be used for many different quality inspection purposes.


These and other technologies will be displayed.

Top-Eye™ Digital Microscope for topography analysis Micro-Eye™ Digital Microscope Quality Inspection Platform
DIMIC™ LT Laser Topography Digital Video Microscope Smart-Eye™ Wireless Microscope
Interplastica 2010

HET Instrument: the biggest technology exhibition in the Benelux.

    The subject of HET Instrument 2010:

  • Industrial Electronics
  • Industrial Automation
  • Laboratory Technology

Place:

Hall 1, booth C075
Amsterdam RAI
Europaplein 22
NL 1078 GZ
Amsterdam
Netherlands

Date:

September 28 - October 1, 2010


Registration

HET Instrument 2010 offers the exhibiting companies the possibility to present their innovations, products and services while allowing broad professional public to gain comprehensive information about the trends in medical and laboratory equipment, pharmaceutics and optics.

click here to visit HET Instrument 2010 site

If you can not visit us on HET Instrument 2010, please don't hesitate to contact us or please look for our both on other coming exhibitions!


Flokal offers complete solutions in the field of Characterization and Quality control based on Digital Imaging Analysis technology.

Our products find usage in many fields, i.e. Micro electronics, Material Science, Biology, Cosmetic, Agriculture, Medical, Pharmaceutical, Machine Tools, Plastics, Chemical, Semiconductor, Laboratory, Forensic, Museums, Art, Jewelry, Education and more.

Our technology goes beyond the standard requirements: from state of the art microscopy for material research to reliable and operator friendly inspection in harsh process environments. We encourage our customers to open the dialogue with our engineering team and challenge us with their application where other companies have given up.

You are welcome to bring your sample and discover with us all the possibilities of state of the art visual inspection!

 

© Copyright Flokal 2010